Scanning Electron Microscopy The individual using such microscope can adjust the focus, contrast, and magnification of microscopic creatures viewed at thousands of times their actual size. Translational Microscopy Students must first focus the sample then move the sample in all directions to thoroughly explore the various features exhibited by the sample. Intensity or brightness and zoom controls permit fine-tuning of the microscopic images. Magnifying Microscopy It delves into the effect of increasing magnification or is equivalent to changing microscope objectives on the ability to resolve features in a sample. Laser Scanning Confocal Microscopy Several methods have been improved to overcome the poor contrast innate with imaging thick specimens in a conventional microscope. Specimens having a moderate degree of thickness will produce dramatically improved images with either confocal or deconvolution techniques. The thickest specimens will suffer from a tremendous amount of extraneous light in out-of-focus regions, and are probably best-imaged using confocal techniques. Microscopy of Silicon Artwork Study the appearance of silicon artwork under varying conditions of illumination. Sliders control specimen focus, brightness and magnification. The user chooses between brightfield, darkfield, and differential interference contrast illumination.

Phase Contrast Microscopy It explores how phase plate alignment with respect to the objective phase ring affects specimen contrast in phase contrast microscopy. It permits the user to adjust the positioning of the phase plate slits using a virtual phase telescope. Specimen illumination is adjustable via the microscope illumination voltage, and the magnification can be varied from 4x to 40x. A fine focus slider is also provided to optimize specimen focus. Stereoscopic Zoom Microscopy Specimens are to be prepared and microscope focus and lamp intensity should be set to optimize appearance of the image. The magnification range for this microscope is 0.75x to 11.25x, which can be adjusted with a variable slider. Reflected Light Confocal Microscopy It searches microscopy of integrated circuits using real-time confocal observations at a resolution of 0.18 microns. Integrated Circuit Inspection Microscopy Imagine yourself in a chip fab inspecting wafers with a reflected light microscope. It delves into the surface structure of integrated circuits using brightfield, darkfield or differential interference contrast microscopy. After choosing a specimen to examine, the visitor can toggle between the different illumination modes, adjust the focus and brightness, and change the magnification.

Polarized Light Microscopy When a birefringent material is placed between crossed polarizer in an optical microscope, light incident upon the material is divided into two component beams whose intensity and amplitude vary depending upon the orientation angle between the polarizer and permitted vibration directions of the material. Microscopy of the Silicon Zoom It investigates image variations during rotation of the polarizer in the light path of a differential interference contrast reflected light microscope. Whereas examination of doodles on integrated circuits, image contrast and varying of the color can be demonstrated with rotation of the polarizer. Hoffman Modulation Contrast Microscopy Hoffman modulation contrast is an indirect illumination technique that allows microscopists to improve contrast in semi-transparent phase objects, which are difficult to picture using conventional brightfield microscopy. Optical Staining or Rheinberg Illumination Microscopy It presents how changes in the color of central and annular filters affect sample and background color when using Rheinberg illumination as a contrast-enhancing method in optical microscopy.

Differential Interference Contrast Microscopy The Differential Interference Contrast Microscopy explores how adjustments in the orientation of the polarizer in a Senarmont compensation system will affect image contrast. Virtual Microscopy Depth-of Focus in Thick Samples It allows the user to investigate how microscope depth-of-focus can be modified to bring different parts of a very thick specimen into sharp focus. Fluorescence Microscopy with Multiple Fluorochromes Fluorescence microscopy takes advantage of emission spectral properties of the fluorochrome dyes being utilized to specifically stain various portions of a specimen. It explores how samples stained with multiple fluorochrome stains appear when excitation illumination is filtered through various fluorescence cubes. Fluorescence Combination Microscopy It shows the mixture of fluorescence microscopy with either phase contrast or differential interference contrast microscopy. The user can choose between views of the various techniques separately or combined to produce increased contrast effects.